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Joint Research Project Participation

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The following declaration must be made by the user when registering an interest in an SRT/SNT

  • I (the user) understand that by registering an interest in this SRT/SNT that the connections data (First Name, Family Name, Institute Name, Country and Email address) I provide will be accessible to users of the MSU website as follows.
    • First Name and Family Name will be visible against the specific SRT/SNT
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Submit Date Name Organisation Statement of capabilities/facilities
2020-07-01. Felicien SCHOPFER LNE LNE is the French National Metrology Institute and a recognized testing laboratory. LNE has been leading graphene research works since 2007 for application in quantum electrical metrology. Based on the comprehensive capabilities of LNE-Nanotech institute, dedicated to nanometrology, LNE also develops reliable and accurate measurement methods for graphene-based materials, within the objective to support innovation, industrialization and commercialization. LNE is partner of the Graphene Flagship Validation Service, involved in standardization activities at VAMAS TWA41, ISO/TC229, IEC/TC113, AFNOR/X457. For SRT-n04, the proposed contribution is mainly on Scanning Microwave Microscopy for electrical imaging at the nanoscale, including sheet resistance measurements traceable to the SI (to be developed). The instrument is installed in a N2 glove box for control of the ambient conditions (humidity, temperature). A second conductive AFM and 4 point probe station can also be used.
2020-06-24. Alexandra Fabricius VDE DKE The DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE as a joint organization of VDE and DIN (VDE DKE) is the German National Committee for CENELEC and IEC. The DKE provides comprehensive services in the field of standardization and holds the secretariat of IEC/TC 113 Nanotechnology for electrotechnical products and systems.
2020-06-24. Elena Taboada das-Nano das-Nano develops and manufactures terahertz time-domain spectrometers (THz-TDS) which allow non-contact, non-destructive and fast characterization of the electrical properties of graphene and 2D materials.
2020-06-22. Luca Callegaro Istituto Nazionale di Ricerca Metrologica INRIM is the Italian national metrology institute. The expertise comes from the Quantum Metrology and Nanotechnologies Division, Research Sector QN02: Quantum electrical metrology, and the Applied Metrology and Engineering Division, Sector AE04: Physical Thermodynamics. INRIM has actively contributed to the development of electromagnetic metrology of materials, thin films and devices, and the realisation of temperature and humidity standards. Recent developments include the characterization of electronic nanodevices, quantum Hall devices, a facility for extended van der Pauw - electrical resistance tomography of thin films, and the realisation of primary humidity generators, humid gas calibration facilities, relative humidity and water activity measurements. The INRIM researchers involved in the project are or were also involved in EMPIR 16NRM01 GRACE Developing electrical characterisation methods for future graphene electronics. The writer is the GRACE Coordinator.

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