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Joint Research Project Participation

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Submit Date Name Organisation Statement of capabilities/facilities
2019-07-01. Karsten Albe Technische Universität Darmstadt We can offer ab-initio calculations on:

Electronic defect calculations (electronic and optical properties, thermodynamic stability, kinetic properties and solubility of defects and impurities)

interface degradation

influence of strain on structural, electronic and transport properties of bulk and interface systems
2019-06-28. Didier Theron CNRS-IEMN - Scanning Microwave Microscopy (SMM) characterization from 2 to 18 GHz under air.
- Capacitance calibration using capacitance standards (100 aF - fF range
- Doped silicon thin films measurement. Determination of effective contact area of probes.
- Instrumentation development of an home made SMM in a Scanning Electron Microscope (SEM)
- Electromagnetic modeling of microwave SMM probes targeting measurements up to 110 GHz.
2019-06-27. Lapini Andrea INRIM (Istituto Nazionale di Ricerca Metrologica) We can offer the following capabilities in view of the objectives stated in the SRT:
Characterization of the stress effect and defect propagation in photosensitive material by optical spectroscopic techniques.
In particular:
-Coherent Raman Spectroscopy and Microscopy (CARS and SRS) with sub-micron resolution.
-Spontaneous Raman Spectroscopy/microscopy (1 micron resolution).
-Atomic force microscopy for surface characterization.
2019-06-26. Klapetek Petr Czech Metrology Institute Scanning probe microscopy methods (mechanical, electrical, thermal, optical) up to large (centimeter) areas, numerical modeling of the probe-sample interaction in SPM for most of the measurement regimes, hybrid data processing methods development, uncertainty estimation in SPM, traceability.
2019-06-26. Roland Mainz Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH The methods we can offer are
* Lab-based real-time in-situ X-ray diffraction (XRD) with time resolutions below 1 second
* Real-time in-situ X-ray fluorescence (XRF)
* Real-time in-situ White Light Reflectometry (WLR)
* Real-time in-situ Photolumenescence
These measurements can be done simultaneously and under inert or reactive environments to study degradations, phase transitions, the evolution of chemical gradients and structural defects, and their correlation to opto-electronic properties.

Further, we can offer to provide perovskite samples.
2019-06-26. Yves Kayser Physikalisch-Technische Bundesanstalt Capabilities which can be offered in view of the objectives stated in the SRT:
- Traceable characterization by means of X-ray spectroscopy: elemental quantification and chemical speciation (investigation of the electronic structure or structural information) by means of reference-free XRF, XES, (N)EXAFS, RIXS. These techniques can be applied under static and operando conditions. The goal would be time-resolved studies on changes indcued on the time scale of minutes to hours while correlating these studies with integral characterisations.
- Grazing Incidence or Emission X-ray fluorescence techniques applied to element-sensitive depth profiling applications (implantation profiles, layers, multilayers, nanoparticles) to study elemental depth distribution as a dependence of the age or different external stimuli applied to study changes in diffusion or at interfaces
- Physically traceable, absolute elemental mass speciation with mapping capabilities (resolution of 30 micormeters or better.
2019-06-26. Bernd Kästner PTB 1) Degradation by dose - controlled irradiation with in-situ UPS/XPS analysis (using Metrology Light Source, monochromatized radiation 1.55 eV - 283 eV)
Quantified radiant exposure of about 10 MJ/m2

2) IR hyperspectral imaging, cross-scale, mm-size, down to nanometer resolution, allowing simultaneously to chemical information to exctract Drude resistivity contactless (as long as plasmon frequency within 300 - 5000 cm^-1)

3) Fotocurrent nanoscopy for dimensional grain and defect analysis
2019-06-25. Axel Kranzmann Bundesanstalt für Materialforschung und -prüfung - Experimental aging under combined conditions of temperature, humidity, pressure, electrical load
- transmission electron microscopy
- Scanning electron microscopy and phase analysis using EBSD
- X-ray Analytics

Experience in previous EUROMET projects
2019-06-24. François Piquemal LNE LNE is a French National Metrology Institute and an internationally recognized testing laboratory. Within the framework of LNE-Nanotech institute, dedicated to metrology at the nanoscale, LNE develops capabilities to insure traceable measurements of electrical and thermal quantities at the nanoscale. For SRT-G19, the proposed contribution is based on SPM methods:
- Scanning Microwave Microscope techniques for doping concentration, capacitance or dielectric permittivity;
- Conductive AFM techniques based on Resiscope for resistivity;
- SThM techniques for measuring the thermal conductivity
The SMM is installed in a N2 glove box for control of the ambient conditions (humidity, temperature). Also, LNE has access to accelerated ageing capabilities (UV, HR, T, salt mist, H2S, vibrations, mechanical stress, etc) for life duration prediction and reliability analysis.
2019-06-19. Paul THOMPSON University of Liverpool The University of Liverpool (ULiv), along with the University of Warwick owns and manages a materials science synchrotron radiation beamline at the European Synchrotron Radiation Facility. This forms part of the larger European Photon and Neutron Science Campus located in Grenoble France. Both X-ray diffraction and spectroscopies are available, as well as in-operando electrical measurement capabilities up to a frequency of approximately 100 kHz.
2019-06-18. Markys Cain Electrosciences Ltd We are a current partner on the EMPIR ADVENT project. Expertise and interests in measurement tools development of advanced functional materials - piezoelectrics, ferroelectrics, multiferroics, thermoelectrics, photovoltaics. Linking functional response to in situ, in operando X-Ray synchrotron diffraction and related spectroscopies. Lifetime, fatigue and ageing are all quite distinct characteristic parameters that require metrological development for many energy materials.
2019-06-17. Marie-Christine Lépy CEA X-ray analysis capabilities using monochromatic X-ray sources
Grazing incidence X-ray fluorescence (GIXRF) for thin films characterization
Heating module included in the GIXRF chamber
Measurement of atomic parameters (attenuation coefficients, fluorescence yields)
2019-06-17. Gareth Hinds NPL Metrology for high energy density batteries and supercapacitors, battery/supercapacitor testing (cells, modules and packs), in situ diagnostics, modelling, development of standard test methods
2019-06-05. Andreas Hertwig BAM Participant in previous projects ThinFilms, TReND, ThinErgy, HyMET. Optical surface, layer, and interface analysis. Ellipsometry, Topometry, SPM methods, FTIR-microanalysis. Hybrid investigation methodologies. Multidimensional analysis with mapping and imaging. Standardisation of data analysis.

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