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|Submit Date||Name||Organisation||Statement of capabilities/facilities|
|2019-06-05.||Andreas Hertwig||BAM||Participant in previous projects ThinFilms, TReND, ThinErgy, HyMET. Optical surface, layer, and interface analysis. Ellipsometry, Topometry, SPM methods, FTIR-microanalysis. Hybrid investigation methodologies. Multidimensional analysis with mapping and imaging. Standardisation of data analysis.|
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