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|Submit Date||Name||Organisation||Statement of capabilities/facilities|
|2020-06-25.||Ivano Ruo-Berchera||INRIM||Quantum Optics
Quantum enhanced measurement especially with Spontaneous Parametric Down Conversion quantum correlated sources and single photon sources.
Super-resolution by high order correlation measurement
Quantum based absolute detector calibration
|2020-06-23.||Omar El Gawhary||VSL||Dutch Metrology Institute. Expertise in direct and inverse scattering problems applied to dimensional metrology. Superresolution, optical scatterometry (home-built systems), hyper spectral scatterometry combined with ptychography for phase retrieval. Coordination of the EMPIR project BeCOMe.|
|2020-06-23.||Deb Roy||Swansea University||Nano scale spectroscopy, label-free imaging (Raman, PL etc). nano-optics, characterisation of organic and inorganic nanoscale structures.|
|2020-06-17.||Bernd Bodermann||PTB||Optical Micro- and Nanometrology: Scatterometry, Microscopy, Mueller Ellipsometry, rig. modelling, SEM, AFM and other supplementary optical metrology, hybrid metrology|
|2020-06-15.||Sven Burger||JCMwave GmbH||We have longstanding expertise in developing and applying numerical methods for optical nanometrology. This includes adaptive methods for light scattering and eigenvalue problems and for solving inverse problems. In this SRT we would like to contribute especially to investigating methods for exploiting resonances in nanophotonic setups.
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