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Joint Research Project Participation

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Submit Date Name Organisation Statement of capabilities/facilities
2020-06-25. Ivano Ruo-Berchera INRIM Quantum Optics
Quantum enhanced measurement especially with Spontaneous Parametric Down Conversion quantum correlated sources and single photon sources.
Quantum imaging
Super-resolution by high order correlation measurement
Quantum based absolute detector calibration
2020-06-23. Omar El Gawhary VSL Dutch Metrology Institute. Expertise in direct and inverse scattering problems applied to dimensional metrology. Superresolution, optical scatterometry (home-built systems), hyper spectral scatterometry combined with ptychography for phase retrieval. Coordination of the EMPIR project BeCOMe.
2020-06-23. Deb Roy Swansea University Nano scale spectroscopy, label-free imaging (Raman, PL etc). nano-optics, characterisation of organic and inorganic nanoscale structures.
2020-06-17. Bernd Bodermann PTB Optical Micro- and Nanometrology: Scatterometry, Microscopy, Mueller Ellipsometry, rig. modelling, SEM, AFM and other supplementary optical metrology, hybrid metrology
2020-06-15. Sven Burger JCMwave GmbH We have longstanding expertise in developing and applying numerical methods for optical nanometrology. This includes adaptive methods for light scattering and eigenvalue problems and for solving inverse problems. In this SRT we would like to contribute especially to investigating methods for exploiting resonances in nanophotonic setups.

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