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|Submit Date||Name||Organisation||Statement of capabilities/facilities|
|2019-06-26.||Orlando Teodoro||FCT/UNL||Dear coordinator
We are a group with good background on XPS characterization of graphene and graphene based materials and we would like participate in this project. We can demonstrate our background if you are interested in our contribution.
We realize that this message is being sent to late, but if possible take it into consideration.
|2019-06-18.||Sebastien Ducourtieux||LNE||LNE (French National Metrology Institute)
Involved in Vamas TWA-41
Expert at ISO TC229, IEC TC 113
Metrology of graphene materials and products
capabilities specifically involved in the project : AFM, metrological AFM for traceability, SEM, BET, ICP-MS, DLS, deposition technics dedicated to nano-object
All these techniques are integrated in a comprehensive range of capabilities gathered at LNE Nanotech Institute
|2019-06-17.||Charles Clifford||NPL||Leading member of ISO TC229 (nanotechnologies)
Chair of VAMAS TWA 41
Structural and chemical characterisation of graphene
Experts in Raman, AFM, SEM, XPS
|2019-06-17.||Manuel Vazquez Sulleiro||IMDEA Nanociencia||IMDEA Nanociencia is a non-profit Foundation created in 2006 by the regional Government of the Community of Madrid. With more than 170 researchers in a 10,000 m^2 facility (including a 200 m^2 clean room) can offer capabilities and infrastructures in the full value chain of graphene research:
6. Theory and Modelling
These activities are developed through 6 Research Programmes of the Institute:
a. Molecular Nanoscience and Chemical Synthesis
b. Time-resolved Optical Spectroscopy
c. Scanning Probe Microscopies and Surfaces
d. Transport in 2D systems
e. Nanostructured Functional Surfaces
f. Quantum Nanodevices
For more information please visit: https://www.nanociencia.imdea.org/research/research-programs
|2019-06-17.||Jörg Radnik||BAM||XPS, SEM, TEM, NEXAFS, method combination, VAMAS, ISO, CEN, Interlaboratory Comparisons, CCQM, OECD,|
|2019-06-13.||chiara portesi||INRIM||Raman spectroscopy, Raman imaging, TERS apparatus|
© EURAMET e.V. 2019