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Joint Research Project Participation

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Submit Date Name Organisation Statement of capabilities/facilities
2019-06-26. Orlando Teodoro FCT/UNL Dear coordinator

We are a group with good background on XPS characterization of graphene and graphene based materials and we would like participate in this project. We can demonstrate our background if you are interested in our contribution.

We realize that this message is being sent to late, but if possible take it into consideration.


2019-06-18. Sebastien Ducourtieux LNE LNE (French National Metrology Institute)

Involved in Vamas TWA-41

Expert at ISO TC229, IEC TC 113

Metrology of graphene materials and products

capabilities specifically involved in the project : AFM, metrological AFM for traceability, SEM, BET, ICP-MS, DLS, deposition technics dedicated to nano-object

All these techniques are integrated in a comprehensive range of capabilities gathered at LNE Nanotech Institute
2019-06-17. Charles Clifford NPL Leading member of ISO TC229 (nanotechnologies)
Chair of VAMAS TWA 41
Structural and chemical characterisation of graphene
Experts in Raman, AFM, SEM, XPS
2019-06-17. Manuel Vazquez Sulleiro IMDEA Nanociencia IMDEA Nanociencia is a non-profit Foundation created in 2006 by the regional Government of the Community of Madrid. With more than 170 researchers in a 10,000 m^2 facility (including a 200 m^2 clean room) can offer capabilities and infrastructures in the full value chain of graphene research:

1. Synthesis
2. Characterization
3. Funcionalization
4. Devices
5. Applications
6. Theory and Modelling

These activities are developed through 6 Research Programmes of the Institute:

a. Molecular Nanoscience and Chemical Synthesis
b. Time-resolved Optical Spectroscopy
c. Scanning Probe Microscopies and Surfaces
d. Transport in 2D systems
e. Nanostructured Functional Surfaces
f. Quantum Nanodevices

For more information please visit:
2019-06-17. Jörg Radnik BAM XPS, SEM, TEM, NEXAFS, method combination, VAMAS, ISO, CEN, Interlaboratory Comparisons, CCQM, OECD,
2019-06-13. chiara portesi INRIM Raman spectroscopy, Raman imaging, TERS apparatus

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